Theoretical and computational modelling of x-ray scattering from bulk and thin film materials
Funding or Partner Organisation: National Institute of Standards and Technology (National Institute of Standards and Technology - Ceramics Division)
Start year: 2003
Summary: Efficient and reliable characterization of bulk materials and epitaxial thin films used in the computer chip industry can be achieved using x-ray diffraction techniques.
FOR Codes: Nanotechnology, Condensed Matter Physics-Structural Properties, Technological and organisational innovation, Physical sciences, Manufacturing standards and calibrations, Expanding Knowledge in the Physical Sciences