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Nanometre spatial resolution vacuum ultra-violet scanning cathodoluminescence imaging and analysis of wide band gap opto-electronic materials and devices

Project Member(s): Phillips, M.

Start year: 2003

Summary: This project aims to develop a vacuum ultra-violet (VUV) scanning cathodoluminescence system on a Schottky field emission gun scanning electron microscope. This unique instrumentation will facilitate for the first time high quality deep UV (30-350nm) CL imaging and analysis of opto-electronic materials and devices at nanometre spatial resolution. The project will use this VUV-CL system to investigate the effect of dopants, impurities and defects as well as strain on the emission wavelength and emission efficiency of AlGaN materials and devices (particularly quantum well and dot structures), to improve UV device performance and fabrication technology.''

Keywords: Cathodoluminescence Opto-electronic Materials Aluminium Gallium Nitride Wide Band Gap Materials Microanalysis Electron Microscopy

FOR Codes: Materials Engineering not elsewhere classified, Instruments and Techniques, Physical sciences, Scientific instrumentation, Expanding Knowledge in the Physical Sciences, Synchrotrons; Accelerators; Instruments and Techniques, Scientific Instruments