Automatic 3D Measurement: Accuracy Improvement via Enhanced Deep Learning

Project Member(s): Ha, Q.

Funding or Partner Organisation: ApparelTech Pty Ltd
ApparelTech Pty Ltd

Start year: 2020

Publications:

Tran, XT, Dinh, TH, Le, HV, Zhu, Q & Ha, Q 1970, 'Defect detection based on singular value decomposition and histogram thresholding', 2020 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM), 2020 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM), IEEE, Boston, MA, USA, pp. 1149-1154.
View/Download from: Publisher's site

FOR Codes: Information Services not elsewhere classified, Control Systems, Robotics and Automation, Control engineering, mechatronics and robotics, Information services

Acknowledgement of Country

UTS acknowledges the Gadigal people of the Eora Nation, the Boorooberongal people of the Dharug Nation, the Bidiagal people and the Gamaygal people, upon whose ancestral lands our university stands. We would also like to pay respect to the Elders both past and present, acknowledging them as the traditional custodians of knowledge for these lands.