Ageron, M, Albert, A, Barvich, T, Beaumont, W, Beckers, T, Bernier, K, Blüm, P, Boulogne, I, Bouvet, D, Brom, JM, Charles, F, Coffin, J, Contardo, D, Daubie, E, Didierjean, F, De Lentdecker, G, De Troy, J, Devroede, O, Erdmann, M, Ernenwein, JP, Fahrer, M, Flügge, G, Fontaine, JC, Geist, W, Goerlach, U, Gottschalk, M, Helleboid, JM, Huss, D, Iacopi, F, Juillot, P, Kärcher, K, Kühn, F, Lounis, A, Maazouzi, C, Macke, D, Martin, C, Mirabito, L, Moreau, S, Müller, T, Neuberger, D, Nowack, A, Perries, S, Ripp-Baudot, I, Röderer, F, Schulte, R, Shekhtman, L, Simonis, HJ, Struczinski, W, Tatarinov, A, Thümmel, WH, Udo, F, Vander Velde, C, Van Doninck, W, Van Dyck, C, Vanlaer, P, Van Lancker, L, Weiler, T, Zander, A, Zghiche, A & Zhukov, V 2002, 'Experimental and simulation study of the behaviour and operation modes of MSGC+GEM detectors', Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 489, no. 1-3, pp. 121-139.
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Bell, TDM, Ghiggino, KP, Jolliffe, KA, Ranasinghe, MG, Langford, SJ, Shephard, MJ & Paddon-Row, MN 2002, 'Photoinduced Energy and Electron Transfer in a Giant Zinc Porphyrin−Bridge−C60 System', The Journal of Physical Chemistry A, vol. 106, no. 43, pp. 10079-10088.
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Boardman, G, Zhu, JG & Ha, QP 2002, 'Analysis of the steady state performance of doubly fed induction machines', Journal of Electrical and Electronics Engineering, Australia, vol. 22, no. 3, pp. 211-218.
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This paper discusses the steady state maximum and minimum torque outputs and the operation at unity power factor of the doubly fed twin stator induction machine and the doubly fed induction machine using equations with analytical solutions. Speeds above and below the natural or synchronous speed are discussed. The results of simulations, based on a laboratory machine comprising two nominally identical wound rotor induction machines, are presented. It is shown that the maximum torque for the doubly fed machine is independent of speed and for the doubly fed twin stator induction machine there are variable maxima and minima dependent on speed.
Bradby, JE, Kucheyev, SO, Williams, JS, Jagadish, C, Swain, MV, Munroe, P & Phillips, MR 2002, 'Contact-induced defect propagation in ZnO', APPLIED PHYSICS LETTERS, vol. 80, no. 24, pp. 4537-4539.
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Contact-induced damage has been studied in single-crystal (wurtzite) ZnO by cross-sectional transmission electron microscopy (XTEM) and scanning cathodoluminescence (CL) monochromatic imaging. XTEM reveals that the prime deformation mechanism in ZnO is the nucleation of slip on both the basal and pyramidal planes. Some indication of dislocation pinning was observed on the basal slip planes. No evidence of either a phase transformation or cracking was observed by XTEM in samples loaded up to 50 mN with an ∼4.2 μm radius spherical indenter. CL imaging reveals a quenching of near-gap emission by deformation-produced defects.Both XTEM and CL show that this comparatively soft material exhibits extensive deformation damage and that defects can propagate well beyond the deformed volume under contact. Results of this study have significant implications for the extent of contact-induced damage during fabrication of ZnO-based (opto)electronic devices. © 2002 American Institute of Physics.
Bradby, JE, Kucheyev, SO, Williams, JS, Wong-Leung, J, Swain, MV, Munroe, P, Li, G & Phillips, MR 2002, 'Indentation-induced damage in GaN epilayers', APPLIED PHYSICS LETTERS, vol. 80, no. 3, pp. 383-385.
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The mechanical deformation of wurtzite GaN epilayers grown on sapphire substrates is studied by spherical indentation, cross-sectional transmission electron microscopy (XTEM), and scanning cathodoluminescence (CL) monochromatic imaging. CL imaging of indents which exhibit plastic deformation (based on indentation data) shows an observable 'footprint' of deformation-produced defects that result in a strong reduction in the intensity of CL emission. Multiple discontinuities are observed during loading when the maximum load is above the elastic-plastic threshold, and such a behavior can be correlated with multiple slip bands revealed by XTEM. No evidence of pressure-induced phase transformations is found from within the mechanically damaged regions using selected-area diffraction patterns. The main deformation mechanism appears to be the nucleation of slip on the basal planes, with dislocations being nucleated on additional planes on further loading. XTEM reveals no cracking or delamination in any of the samples studied for loads of up to 250 mN. © 2002 American Institute of Physics.
Cortie, MB & Levey, FC 2002, 'Formation, modulation and adaptive twinning of martensite in the Au7Cu5Al4 shape memory system', INTERMETALLICS, vol. 10, no. 1, pp. 23-31.
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The Au7Cu5Al4 ? electron phase transforms displacively from an L21 parent to a nominally body-centred tetragonal martensite with c/a<1. The compound is of interest because it has the potential to serve as an 18 carat shape memory alloy in jewellery. Analysis of its X-ray diffraction spectra indicates that the martensite is modulated by a Image transverse shear wave, showing that it belongs, strictly speaking, to the generic B19 structure type. The martensite is also twinned, and the probable twinning structure is explored. A Image stacking sequence is deduced, which for reasons of the L21 ordering inherited from the parent phase, must be doubled to produce a notional Image martensite that properly repeats. However, although the measured X-ray diffraction spectra can be substantially explained by the structures derived, the martensite probably also has additional, higher-order lattice modulations.
Cortie, MB & Van Der Lingen, E 2002, 'Catalytic gold nano-particles', Materials Forum, vol. 26, pp. 1-14.
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Although gold is the most inert of all metallic elements, it has interesting properties as a heterogeneous catalyst. There are a number of curious aspects to catalysis by gold that are currently attracting academic investigation, while the observation that gold-based catalysts are active at room temperature and below is driving considerable industrial interest. However, much is still not understood about these catalysts and, for example, apparently similar preparation techniques result in activities of hugely varying magnitude. In the present paper we assess the known phenomenology of heterogeneous catalysis by gold, with particular reference to the material properties of the individual nano-particles of catalyst and the many disagreements in the literature. Even the structure of the nano-particles is uncertain, with claims being made for truncated octahedra, cub-octahedra, icosahedra, various kinds of decahedra, and amorphous structures. As far as uncertainty concerning the mechanism of catalysis is concerned, we show that the situation has not yet been resolved, with evidence that catalysis can proceed even in the absence of either a discrete particulate morphology or an oxide support. One possibility is that more than one mechanism applies. Alternatively, the explanation may be that the activity of gold as a catalyst is determined only by the availability of surface gold atoms with low coordination numbers and an associated electron density suitable for whatever reaction is being catalysed. In this case, the role of the oxide support and of gold particle size and structure is indirect, and they would serve mainly to modulate the specific surface area of the gold, and the electronic configuration of its surface atoms.
Fallon, GD, Lee, MA-P, Langford, SJ & Nichols, PJ 2002, 'Metalloporphyrin Molecular Sieves Based on Tin(IV)porphyrin Phenolates', Organic Letters, vol. 4, no. 11, pp. 1895-1898.
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Gauvin, R, Griffin, B, Nockolds, C, Phillips, M & Joy, DC 2002, 'A method to measure the effective gas path length in the environmental or variable pressure scanning electron microscope', Scanning, vol. 24, no. 4, pp. 171-174.
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AbstractA simple method is described to determine the effective gas path length when incident electrons scatter in the gas above the specimen. This method is based on the measurement of a characteristic x‐ray line emitted from a region close to the incident beam. From various experimental measurements performed on various microscopes, it is shown that the effective gas path length may increase with the chamber pressure and that it is also often dependent of the type of x‐ray bullet.
Gelhausen, O, Klein, HN, Phillips, MR & Goldys, EM 2002, 'Influence of low-energy electron beam irradiation on defects in activated Mg-doped GaN', APPLIED PHYSICS LETTERS, vol. 81, no. 20, pp. 3747-3749.
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The influence of low-energy electron beam irradiation (LEEBI) on residual hydrogen impurities and defects in activated magnesium doped gallium nitride layers was studied. In-plane and depth-resolved cathodoluminescence imaging revealed the correlation between the spatial distribution of the injected carriers and the depth and lateral distribution of activated magnesium acceptors. It was found that the hydrogen dissociation results from electron-hole recombination at hydrogen defect complexes and is associated with the generation of additional defect centers.
Godlewski, M, Goldys, EM, Phillips, M, Böttcher, T, Figge, S, Hommel, D, Czernecki, R, Prystawko, P, Leszczynski, M, Perlin, P, Wisniewski, P, Suski, T, Bockowski, M, Grzegory, I & Porowski, S 2002, 'Relationship between Sample Morphology and Carrier Diffusion Length in GaN Thin Films', Acta Physica Polonica A, vol. 102, no. 4-5, pp. 627-632.
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Scanning and spot-mode cathodoluminescence investigations of homo-and hetero-epitaxial GaN films indicate a surprisingly small influence of their microstructure on overall intensity of a light emission. This we explain by a correlation between structural quality of these films and diffusion length of free carriers and excitons. Diffusion length increases with improving structural quality of the samples, which, in turn, enhances the rate of nonradiative recombination on structural defects, such as dislocations.
Guo, YG & Zhu, JG 2002, 'Magnetic field calculation of claw pole permanent magnet machines using magnetic network method', Journal of Electrical and Electronics Engineering, Australia, vol. 22, no. 1, pp. 69-77.
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This paper reports the three-dimensional magnetic field analysis using the magnetic network method for evaluation of parameters and performance of a claw pole permanent magnet machine. The magnetic network model is built based on the principle of equivalent magnetic flux pipes and the network equations are derived to solve the nodal magnetic scalar potentials, which are used to calculate the magnetic flux flowing through different cross-sectional areas. The results are validated by 3D finite element method. The magnetic network technique has the advantage of combining the speed of the conventional magnetic circuit method and the computational accuracy of finite element analysis.
Guo, ZP, Wang, GX, Konstantinov, K, Liu, HK & Dou, SX 2002, 'Electrochemical properties of orthorhombic LiMnO2 prepared by one-step middle-temperature solid-state reaction', Journal of Alloys and Compounds, vol. 346, no. 1-2, pp. 255-259.
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Hurst, SK, Cifuentes, MP, McDonagh, AM, Humphrey, MG, Samoc, M, Luther-Davies, B, Asselberghs, I & Persoons, A 2002, 'Organometallic complexes for nonlinear optics', Journal of Organometallic Chemistry, vol. 642, no. 1-2, pp. 259-267.
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Hurst, SK, Cifuentes, MP, McDonagh, AM, Humphrey, MG, Samoc, M, Luther-Davies, B, Asselberghs, I & Persoons, A 2002, 'Organometallic complexes for nonlinear optics: Part 25. Quadratic and cubic hyperpolarizabilities of some dipolar and quadrupolar gold and ruthenium complexes', Journal of Organometallic Chemistry, vol. 642, no. NA, pp. 259-267.
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A range of dipolar and quadrupolar gold and ruthenium acetylides have been prepared and their electrochemical (Ru complexes) and nonlinear optical properties assessed; electronic communication between the metal centers diminishes as the ?-delocalizable bridge is lengthened and quadratic NLO merit increases on replacing triarylphosphine by trialkylphosphine. One diruthenium example has the largest two-photon absorption cross-section/molecular weight value observed thus far for an organometallic complex.
Iacopi, F, Brongersma, SH, Abell, TJ & Maex, K 2002, 'Buckling instabilities of thin cap layers deposited onto low-k dielectric films', MRS Proceedings, vol. 734.
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ABSTRACTCompressive stresses in thin capping films deposited onto low-k dielectric substrates are particularly prone to relaxation through buckling. This is due to insufficient cap/low-k film adhesion energy and to the compliance of low dielectric constant films. Low-k dielectric films, especially when porous, have low elastic modulus and demonstrate poor adhesion to other layers.When adhesion is poor the cap film can locally buckle as if unconstrained. The buckle front can propagate like a crack and lead to complete delamination of the cap layer. If the cap/low-k film adhesive energy is high, wrinkling instabilities can take place under specific conditions determined by the geometry and the mechanical properties of the stack. In this case the dielectric also deforms due to stress relaxation. A theoretical and experimental evaluation of the parameters influencing the occurrence of these instabilities is presented. This study was carried out to explore the application and reliability of low-k materials as dielectrics for advanced interconnects.
Iacopi, F, Tokei, Z, Le, QT, Shamiryan, D, Conard, T, Brijs, B, Kreissig, U, Van Hove, M & Maex, K 2002, 'Factors affecting an efficient sealing of porous low-k dielectrics by physical vapor deposition Ta(N) thin films', JOURNAL OF APPLIED PHYSICS, vol. 92, no. 3, pp. 1548-1554.
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Kucheyev, SO, Toth, M, Phillips, MR, Williams, JS, Jagadish, C & Li, G 2002, 'Chemical origin of the yellow luminescence in GaN', JOURNAL OF APPLIED PHYSICS, vol. 91, no. 9, pp. 5867-5874.
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The influence of ion-beam-produced lattice defects as well as H, B, C, N, O, and Si, introduced by ion implantation, on the luminescence properties of wurtzite GaN is studied by cathodoluminescence spectroscopy. Results indicate that intrinsic lattice defects produced by ion bombardment mainly act as nonradiative recombination centers and do not give rise to the yellow luminescence (YL) of GaN. Experimental data unequivocally shows that C is involved in the defect-impurity complex responsible for YL. In addition, C-related complexes appear to act as efficient nonradiative recombination centers. Implantation of H produces a broad luminescent peak which is slightly blueshifted with respect to the C-related YL band in the case of high excitation densities. The position of this H-related YL peak exhibits a blueshift with increasing excitation density. Based on this experimental data and results reported previously, the chemical origin of the YL band is discussed. © 2002 American Institute of Physics.
Kucheyev, SO, Toth, M, Phillips, MR, Williams, JS, Jagadish, C & Li, G 2002, 'X-ray spectrometry investigation of electrical isolation in GaN', JOURNAL OF APPLIED PHYSICS, vol. 91, no. 6, pp. 3940-3942.
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Electrical isolation of n-type GaN epilayers bombarded with MeV light ions is studied by energy dispersive x-ray spectrometry (EDS). We show that the maximum bremsstrahlung x-ray energy (the Duane-Hunt limit) can be used to monitor the isolation process in GaN. This method allows the dose region above the threshold dose for isolation to be conveniently studied, whereas the application of conventional (low-voltage) electrical techniques in this dose range with large sheet resistances of the material (≳1011/sq) is often impossible due to comparable parasitic resistances of the experimental setup. A correlation of EDS and resistance measurements of GaN strongly suggests that the magnitude of sample charging scales with the number of ion-beam-produced deep electron traps which are empty at equilibrium. The results presented demonstrate the utility of EDS as a powerful and simple technique to study electrical isolation in wide band-gap semiconductors. © 2002 American Institute of Physics.
Langford, SJ, Lau, V-L, Lee, MAP & Lygris, E 2002, 'Porphyrin-based supermolecules and supramolecular arrays', Journal of Porphyrins and Phthalocyanines, vol. 06, no. 12, pp. 748-756.
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This article reviews our recent work in constructing discrete multiporphyrin assemblies and supramolecular arrays through the application of two organising principles - crown ethers and tin(IV)porphyrin phenolates. The role of the crown ethers is illustrated by two examples: (a) the cation-induced control of the reduction potentials within a model 18 C 6 bearing naphthalene and naphthoquinone chromophores antipodally displaced on the crown ether in the presence of alkali metal cations and (b) in the complexation of dialkylammonium salt within the cavity of a 24 C 8 bischlorin system. Tin(IV)porphyrin phenolates provide a means of efficiently constructing multiporphyrin assemblies without the use of covalent bond formation. Their potential is illustrated through the formation of discrete trimers, using a “one pot” self-assembly strategy, as well as the generation of supramolecular arrays with sieve like networks.
Levey, FC, Cortie, MB & Cornish, LA 2002, 'A 500 degrees C isothermal section for the Al-Au-Cu system', METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, vol. 33, no. 4, pp. 987-993.
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The Al-Au-Cu system and its associated ternary alloys and intermetallic compounds is surprisingly poorly known, and the authors could find no phase diagram for it in the literature. This article addresses this omission by presenting an isothermal section at 500 °C, derived with the aid of X-ray diffraction (XRD), energy-dispersive spectroscopy (EDS), metallography, and hardness measurements. The samples studied had generally received an anneal of 2 hours at 500 °C, primarily in order to complete any transformations that occurred during solidification and cooling of the castings. The possibility of further changes on protracted annealing at 500 °C is not ruled out, and the diagram presented is, therefore, applicable only to material prepared by thermal processing of an industrial nature. The presence of a ternary ? phase with a nominal stoichiometry of AlAu2-x Cu1-x (0?x?1) was confirmed, and its phase field at 500 °C was determined. A number of the binary intermetallic phases were found to exhibit some solid solubility of the ternary element. In particular, the ?-Al4Cu9 phase extends deep into the ternary and, in the vicinity of the commercially interesting 18-carat line, appears to exist in a ternary ordered form, designated here as ? 2
Levey, FC, Cortie, MB & Cornish, LA 2002, 'Hardness and colour trends along the 76 wt.% Au (18.2 carat) line of the Au-Cu-Al system', SCRIPTA MATERIALIA, vol. 47, no. 2, pp. 95-100.
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Colour and hardness were measured on a series of alloys along the 76 wt.% Au line of the AuCuAl system. Complex, non-monotonic behaviour was observed, which is shown to be correlated with microstructural changes. The available colours include reddish, yellow, `apricot', white and purple. The hardness of as-cast material varies from 150 to 500 Vickers.
Remond, G, Myklebust, R, Fialin, M, Nockolds, C, Phillips, M & Roques-Carmes, C 2002, 'Decomposition of wavelength dispersive x-ray spectra', Journal of Research of the National Institute of Standards and Technology, vol. 107, no. 6, pp. 509-509.
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Line shapes of atomic lines and soft x-ray emission bands measured with a wavelength dispersive spectrometer (WDS) with the Electron Probe Micro Analyzer (EPMA) are reviewed. Least square fitting to pseudo-Voigt profiles of the digitally measured spectra are used to account for the presence of non-diagram features (high and low energy satellites) and instrumental induced distortions. The effect of line width and relative intensities on the quality of fits is illustrated. Spectral distortions resulting from the presence of absorption edges within the analyzed wavelength region are illustrated for the case of FeLα,β emission bands for pure Fe and iron oxides. For quantitative analysis, an analytical approach is presented where the measured soft x-ray emission bands are corrected for self absorption before extracting the intensities from the experimental data.
Remond, G, Nockolds, C, Phillips, M & Roques-Carmes, C 2002, 'Implications of polishing techniques in quantitative x-ray microanalysi', Journal of Research of the National Institute of Standards and Technology, vol. 107, no. 6, pp. 639-639.
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The implications of the polishing techniques in quantative x-ray microanalysis were discussed. Two and three body abrasive wears, polishing procedures and techniques and characterization of polished surfaces were also discussed. Varying the nature of polishing materials was found to result in different surface and subsurface chemical, physical and textural damages.
Rodgers, KJ, Wang, HJ, Fu, SL & Dean, RT 2002, 'Biosynthetic incorporation of oxidized amino acids into proteins and their cellular proteolysis', FREE RADICAL BIOLOGY AND MEDICINE, vol. 32, no. 8, pp. 766-775.
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We demonstrate that oxidized amino acids can be incorporated into proteins by protein synthesis. The level of incorporation into protein was dependent on the concentration of oxidized amino acid supplied to the cells. At low levels of incorporation, the oxidized amino acids examined increased the degradation rate of the cell proteins. Degradation of certain proteins containing high levels of DOPA (but not ortho or meta tyrosine) was decreased to below the basal degradation rates suggesting that DOPA may contribute to proteins becoming resistant to proteolysis. Changes in the degradation rates of the oxidized amino acid-containing proteins was shown to have no impact on the degradation rates of native proteins, indicating that the activity of the degradative machinery was not affected. We demonstrate that oxidized proteins are selectively degraded by the proteasomes and provide evidence to suggest that the proteasomes and the endosomal-lysosomal systems may act in sequence as well as in parallel. The incorporation approach, unlike cell studies in which an exogenous oxidant is used, allows the degradation rates of the oxidatively modified proteins to be selectively measured, offering a greater sensitivity as well as greatly reducing toxicity to the cell and avoiding oxidative modification of other cell components.
Toth, M, Phillips, MR, Craven, JP, Thiel, BL & Donald, AM 2002, 'Electric fields produced by electron irradiation of insulators in a low vacuum environment', JOURNAL OF APPLIED PHYSICS, vol. 91, no. 7, pp. 4492-4499.
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We report on the properties of electric fields generated as a result of electron irradiation of dielectrics in a low vacuum scanning electron microscope. Individual field components produced by (i) ionized gas molecules located outside the sample surface and (ii) subsurface trapped charge were detected by measurements of changes in (i) primary electron landing energy and (ii) secondary electron (SE) emission current, respectively. The results provide experimental evidence for a recently proposed model of field-enhanced SE emission from electron irradiated insulators in a low vacuum environment [Toth et al., J. Appl. Phys. 91, 4479 (2002)]. Errors introduced into x-ray microanalysis by the electric fields generated by ionized gas molecules can be alleviated by minimizing the steady state ion concentration by the provision of efficient ion neutralization routes. It is demonstrated how this can be achieved using simple sample-electrode geometries. © 2002 American Institute of Physics. © 2002 American Institute of Physics.
Toth, M, Phillips, MR, Thiel, BL & Donald, AM 2002, 'Electron imaging of dielectrics under simultaneous electron-ion irradiation', JOURNAL OF APPLIED PHYSICS, vol. 91, no. 7, pp. 4479-4491.
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We demonstrate that if charging caused by electron irradiation of an insulator is controlled by a defocused flux of soft-landing positive ions, secondary electron (SE) images can contain contrast due to lateral variations in (i) changes in the SE yield caused by subsurface trapped charge and (ii) the SE-ion recombination rate. Both contrast mechanisms can provide information on microscopic variations in dielectric properties. We present a model of SE contrast formation that accounts for localized charging and the effects of gas ions on the SE emission process, emitted electrons above the sample surface, and subsurface trapped charge. The model explains the ion flux dependence of charge-induced SE contrast, an increase in the sensitivity to surface contrast observed in SE images of charged dielectrics, and yields procedures for identification of contrast produced by localized sample charging. © 2002 American Institute of Physics. © 2002 American Institute of Physics.
Ung, AT, Schafer, K, Lindsay, KB, Pyne, SG, Amornraksa, K, Wouters, R, Van der Linden, I, Biesmans, I, Lesage, ASJ, Skelton, BW & White, AH 2002, 'Synthesis and biological activities of conformationally restricted cyclopentenyl-glutamate analogues', JOURNAL OF ORGANIC CHEMISTRY, vol. 67, no. 1, pp. 227-233.
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Wang, GX, Yao, J, Lindsay, M, Chen, Y, Liu, HK, Ryu, SH & Ahn, JH 2002, 'Li Storage Properties of Carbon Nanotubes Prepared by Chemical Vapour Deposition', Journal of Metastable and Nanocrystalline Materials, vol. 12, pp. 18-26.
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Williams, DBG & Lombard, H 2002, 'Deprotection techniques for phosphine-borane complexes: Methods and extraction coefficients', PHOSPHORUS SULFUR AND SILICON AND THE RELATED ELEMENTS, vol. 177, no. 12, pp. 2799-2803.
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Zhong, S, Howes, A, Wang, GX, Bradhurst, DH, Wang, C, Dou, SX & Liu, HK 2002, 'A new process for fabrication of metal-hydride electrodes for nickel–metal hydride batteries', Journal of Alloys and Compounds, vol. 330-332, pp. 760-765.
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Aubin, A-S, Drouin, D & Phillips, MR 1970, 'ESEM Beam Current Measuring Device based on a Planar Schottky Diode', Microscopy and Microanalysis, Oxford University Press (OUP), pp. 1538-1539.
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Das, A, Kokubo, T, Furukawa, Y, Struyf, H, Vos, I, Sijmus, B, Iacopi, F, Van Aelst, J, Le, QT, Carbonell, L, Brongersma, S, Maenhoudt, M, Tokei, Z, Vervoort, I, Sleeckx, E, Stucchi, M, Schaekers, M, Boullart, W, Rosseel, E, Van Hove, M, Vanhaelemeersch, S, Shiota, A & Maex, K 1970, 'Characterisation and integration feasibility of JSR's low-k dielectric LKD-5109', MICROELECTRONIC ENGINEERING, European Workshop on Materials for Advanced Metallization, ELSEVIER SCIENCE BV, VAALS, NETHERLANDS, pp. 25-33.
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Gelhausen, O, Phillips, MR, Klein, HN & Goldys, EM 1970, 'Influence of low-energy electron beam irradiation on defects in activated Mg-doped GaN', MRS Proceedings, Springer Science and Business Media LLC, pp. 653-658.
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ABSTRACTCL spectroscopy studies at varying temperatures and excitation power densities as well as depth-resolved CL imaging were conducted to investigate the impact of low energy electron beam irradiation (LEEBI) on native defects and residual impurities in metal-organic vapor phase epitaxy (MOVPE) grown Mg-doped p-type GaN. Due to the dissociation of (Mg-H)0 complexes, LEEBI significantly increases the (e,Mg0) emission (3.26 eV) at 300 K and substantially decreases the H-Mg donor-acceptor-pair (DAP) emission (3.27 eV) at 80 K. In-plane and depth-resolved CL imaging indicates that hydrogen dissociation results from electron-hole recombination at H-defect complexes rather than heating by the electron beam. The dissociated hydrogen atoms associate with nitrogen vacancies, forming a deeper donor, i.e. a (H-VN) complex. The corresponding deeper DAP emission with Mg centered at 3.1 eV is clearly observed between 160 and 220 K. Moreover, a broad yellow luminescence (YL) band centered at 2.2 eV is observed in MOVPE-grown Mg-doped GaN after LEEBI-treatment. It is suggested that a combination of LEEBI-induced Fermi-level downshift due to Mg-acceptor activation and simultaneous dissociation of gallium vacancy-impurity complexes, i.e. (VGa-H), is responsible for the observed YL.
Griffin, B, Suvorova, A & Phillips, M 1970, 'A review of gas-electron interactions imaging and X-ray analysis in variable pressure SEM', Proceedings of the 15th International Congress on Electron Microscopy, 15th International Congress on Electron Microscopy, Microscopy Society of Southern Africa, Durban, South Africa, pp. 215-216.
Guo, YG, Zhu, JG, Watterson, PA & Wu, W 1970, 'Comparative study of 3D flux electrical machines with soft magnetic composite cores', Conference Record of the 2002 IEEE Industry Applications Conference. 37th IAS Annual Meeting (Cat. No.02CH37344), 2002 IEEE Industry Applications Society Annual Meeting, IEEE, Pittsburgh, USA, pp. 1147-1154.
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Iacopi, F, Baklanov, MR, Sleeckx, E, Conrad, T, Bender, H, Meynen, H & Maex, K 1970, 'Properties of porous HSQ-based films capped by plasma enhanced chemical vapor deposition dielectric layers', JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, pp. 109-115.
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Iacopi, F, Zistl, C, Jehoul, C, Tokei, Z, Le, QT, Das, A, Sullivan, C, Prokopowicz, G, Gronbeck, D, Gallagher, M, Calvert, J & Maex, K 1970, 'Dependence of the minimal PVD TA(N) sealing thickness on the porosity of Zirkon (TM) LK dielectric films', MICROELECTRONIC ENGINEERING, European Workshop on Materials for Advanced Metallization, ELSEVIER, VAALS, NETHERLANDS, pp. 351-360.
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Kokubo, T, Das, A, Furukawa, Y, Vos, I, Iacopi, F, Struyf, H, Aelst, JV, Maenhoudt, M, Tokei, Z, Vervoort, I, Bender, H, Stucchi, M, Schaekers, M, Boullart, W, Van Hove, M, Vanhaelemeersch, S, Peterson, W, Shiota, A, Maex, K, IEEE & IEEE 1970, 'Cu/LKD-5109 damascene integration demonstration using FF-02 low-k spin-on hard-mask and embedded etch-stop', PROCEEDINGS OF THE IEEE 2002 INTERNATIONAL INTERCONNECT TECHNOLOGY CONFERENCE, 5th Annual International Interconnect Technology Conference (IITC), IEEE, BURLINGAME, CA, pp. 51-53.
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Phillips, M & Morgan, SW 1970, 'Time dependent behaviour of positive ions in the variable pressure scanning electron microscope', Proceedings of the 15th International Congress on Electron Microscopy, 15th International Congress on Electron Microscopy, Microscopy Society of Southern Africa, Durban, South Africa, pp. 219-220.
Phillips, MR & Morgan, SW 1970, 'Time Resolved Analysis of the Positive Ion Dynamics in the Variable Pressure Scanning Electron Microscope', Microscopy and Microanalysis, Microscopy & Microanalysis, Oxford University Press (OUP), Canada, pp. 446-447.
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Rémond, G, Fialin, GM, Nockolds, CE, Phillips, MR & Roques-Carmes, C 1970, 'Absorption Correction Of Fe Lα,β Emission From Iron Oxides', Microscopy and Microanalysis, Oxford University Press (OUP), pp. 1496-1497.
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Toth, M, Craven, JP, Phillips, MR, Thiel, BL & Donald, AM 1970, 'X-ray Microanalysis of Insulators in a Variable Pressure Environment', Microscopy and Microanalysis, Microscopy & Microanalysis, Oxford University Press (OUP), Quebec, Canada, pp. 1478-1479.
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Williams, DBG, Lombard, H, Van Niekerk, M & Coetzee, PP 1970, 'Deprotection Techniques for Phosphine-Borane Complexes: Methods and Extraction Coefficients', Phosphorus, Sulfur, and Silicon and the Related Elements, Informa UK Limited, pp. 2115-2116.
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Williams, DBG, Lombard, H, Van Niekerk, M & Coetzee, PR 1970, 'Deprotection techniques for phosphine-borane complexes: Methods and extraction coefficients', PHOSPHORUS SULFUR AND SILICON AND THE RELATED ELEMENTS, 15th International Conference on Phosphorus Chemistry, TAYLOR & FRANCIS LTD, SENDAI, JAPAN, pp. 2115-2116.
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